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Rigaku | Small angle X-ray scattering (SAXS)


Rigaku Nanopix | X-ray microscope

Small angle and wide angle X-ray scattering instrument Advanced SAXS/WAXS for nanostructure analysis

Rigaku NANOPIX SAXS/WAXS measurement system is a new X-ray scattering instrument designed for nano-structure analyses. NANOPIX can be used for both small angle scattering (SAXS) and wide angle scattering (WAXS) measurements, which makes it possible to evaluate multi-scale structures from sub-nanometer to nano-order (0.1 nm to 100 nm). It achieves the highest level of small angle resolution (Qmin to 0.02 nm-1) for a laboratory SAXS instrument.

Small angle X-ray scattering (SAXS)
Small angle X-ray scattering (SAXS) is a technique used to study nano-scale structures of atoms or molecules as well as their non-uniformity by measuring the diffuse scattering from unequal electron density areas. SAXS experiments are performed in a wide range of fields from R&D to quality control.

SAXS/WAXS measurements for many applications
NANOPIX SAXS/WAXS measurement system is applicable to a variety of materials, such as: solids, liquids, liquid-crystals, or gels (with ordered and disordered structures). Diverse applications include: nano-particle size distribution analyses, three-dimensional protein molecule structure analyses, identification of molecular assembly or disassembly, and research of advanced materials, such as carbon fiber-reinforced plastics (CFRP).

Ultra high performance SAXS/WAXS design
Rigaku NANOPIX SAXS/WAXS measurement system is configured with a high-brilliance, high-power point focus X-ray source, the OptiSAXS high-performance multilayer mirror, the ClearPinhole high-performance, low scattering pinhole slits, and the HyPix-3000 high-performance 2D semiconductor detector that enables detecting diffraction and scattering even from anisotropic materials. Optionally, the HyPix-6000 detector is also available for wide angle measurements, offering an expanded detection area by combining two detection modules. As one of the features, the sample-to-detector distance is changeable depending on the structure size ranging from atomic structure (micro-structures: 0.2 - 1 nm) to molecular structure (macro-structures: 1 - 100 nm).

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The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side.

Engineered for Performance
The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.

Designed for Flexibility
Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.

Functionality Redefined
Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the functionality to make the measurements you want to make when you want to make them.

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Easily switch between Johansson and Bragg-Brentano geometry

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