X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze
all kinds of matter—ranging from fluids, to powders and crystals. From research to production
and engineering, XRD is an indispensable method for materials characterization and quality control.
Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users,
which provide the most technically advanced, versatile and cost-effective diffraction
solutions available today.
The 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative
and quantitative analysis of polycrystalline materials. The MiniFlex is available in two variations.
Operating at 600 watts (X-ray tube), the MiniFlex 600 is twice as powerful as other benchtop models,
enabling faster analysis and improved overall throughput. Running at 300 watts (X-ray tube),
the new MiniFlex 300 does not require an external heat exchanger. Each model is engineered to maximize
flexibility in a benchtop package.
Ideally-suited for today's fast-paced XRD analyses, the new 5th generation MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high speed detector coupled with the new 600W X-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, MiniFlex is the only benchtop XRD system with an available sample changer. Whether teaching X-ray diffraction at the college and university level, or routine industrial quality assurance, the MiniFlex delivers both performance and value.
Each MiniFlex comes standard with the latest version of PDXL, Rigaku's full-function powder diffraction analysis package. The latest version of PDXL offers important new functionality; including a fundamental parameter method (FP) for more accurate peak calculation, phase identification using the Crystallography Open Database (COD), and a wizard for ab inito crystal structure analysis.
The original MiniFlex, introduced in 1973, was designed to empower a novice user to produce results, with a compact XRD instrument, comparable to those obtainable by a trained diffractionist. The new MiniFlex builds upon the characteristics which have made it popular for many years – including compact size and robust design – enabling installation in a small space with easy-to-use operation and very low cost-of-ownership.
The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems.
Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted,
permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray
diffractometer can perform many different measurements...fast.
Engineered for Performance
With a multipurpose diffractometer, performance is measured by not only how fast you perform an experiment but also how fast you can switch between different types of experiments. Individual experiments are optimized with accessories like the D/teX Ultra high-speed position sensitive detector system, but the speed between experiments is radically improved with the combination of the automated alignment and CBO.
Designed for Flexibility
The Ultima IV is the only XRD system on the market today that incorporates fully automatic alignment. When coupled with CBO and the in-plane arm, the automatic alignment capability makes the Ultima IV X-ray diffractometer the most flexible system available for multipurpose applications.
In the Ultima IV XRD system, CBO technology eliminates time spent switching geometries, enables everyday users to run both sets of experiments without the need to reconfigure the system, and reduces wear and possible optic damage associated with the recurrent switching process. CBO and automatic alignment combine for the ultimate in functionality for: micro-crystalline diffraction, thin-film diffraction, small angle scattering, and in-plane scattering.
The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most
novel feature is the SmartLab Guidance software, which provides the user with an intelligent
interface that guides you through the intricacies of each experiment. It is like having an expert
standing by your side.
Engineered for Performance
The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.
Designed for Flexibility
Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.
Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the functionality to make the measurements you want to make when you want to make them.
The RAPID II is arguably the most versatile X-ray area detector in the history of materials
analysis. In production for well over a decade and continuously improved during that time
period, the success of the RAPID II is a testament to the suitability of imaging plate
technology for measuring diffraction patterns and diffuse scattering from a wide range of materials.
Engineered for Versatility
It combines an exceptionally large active-area imaging plate that is sensitive to a wide range of radiation sources with the flexibility to mate it with a large variety of X-ray sources and optics. The nature of the imaging plate detector means that weak measurements can be made easily in the presence of strong measurements.
Low Cost of Ownership
Combining a well-proven, time-tested design with the lack of a need for calibration means that the RAPID II is a detector that can be maintained in the field with a minimum of downtime.
The Proof is in the Results
Experiments run on the RAPID II are limited only by the imagination of the researcher. Examples include, phase ID of powder samples, micro-diffraction mapping down to 10 microns, diffuse scattering, fiber diffraction, small molecule structure analysis, stress and texture measurements, etc.
AddspeX supports and delivers all database formats from the ICDD. The release 2015 contains over 815000 unique material records. A record comprises diffraction data, instrument parameters and available crystal structure data. The available formats and subsets are: