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Nex CG
Nex CG

Nex CG


Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards.
Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using monochromatic secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable of routine trace element analysis even in difficult sample types.

Novel software reduces the need for standards
NEX CG is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards.

Features

  • Analyze ₁₁Na to ₉₂U non-destructively
  • Solids, liquids, powders and thin films
  • Polarized excitation for lower detection limits
  • Novel treatment of peak overlap reduces errors
  • PPB detection limits for aqueous samples using UltraCarry
  • Simplified user interface with EZ Analysis


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    Nex DE VS
    Nex DE

    Nex DE VS


    Variable spot size EDXRF spectrometer with QuantEZ software

    High-resolution elemental analysis of Na through U

    As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

    XRF elemental analysis in the field, plant or lab

    Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.

    XRF with 60kV X-ray tube and SDD detector

    The 60kV X-ray tube and Peltier cooled FAST SDD® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

    XRF options: autosampler, vacuum, helium and standardless FP

    Options include fundamental parameters, a variety of automatic sample changers, sample spinner and helium purge or vacuum atmosphere for enhanced light element sensitivity.



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    Nex DE
    Nex DE
    Nex DE

    Nex DE


    As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

    XRF elemental analysis in the field, plant or lab

    Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.

    XRF with 60kV X-ray tube and SDD detector

    The 60kV X-ray tube and Peltier cooled FAST SDD® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

    Options include fundamental parameters, a variety of automatic sample changers, sample spinner and helium purge or vacuum atmosphere for enhanced light element sensitivity.

  • FAST SDD® is a registered trademark of Amptek, Inc.

  • Features
  • Analyze ₁₁Na to ₉₂U non-destructively
  • Powerful QuantEZ Windows®-based software
  • Solids, liquids, alloys, powders and thin films
  • 60kV X-ray tube for wide elemental coverage
  • FAST SDD® detector for superior counting statistics
  • Multiple automated tube filters for enhanced sensitivity
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters software
  • Optional standardless fundamental parameters software


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    Nex QC
    Nex QC

    Nex QC


    NEX QC - Energy Dispersive X-ray Fluorescence Analyzer
    Budget friendly benchtop EDXRF for rapid qualitative and quantitative elemental analysis.

    Rigaku NEX QC energy dispersive X-ray fluorescence (EDXRF) analyzer delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types:

  • Analyze 11Na to 92U non-destructively
  • Solids, liquids, alloys, powders and thin films
  • 50kV X-ray tube for wide elemental coverage
  • Semiconductor detector for superior data quality
  • Modern smartphone style "icon driven" user interface
  • Multiple automated tube filters for enhanced sensitivity
  • Convenient built in thermal printer
  • Low cost with unmatched performance-to-price ratio
  • Optional fundamental parameters

  • Superior EDXRF capabilities with ease-of-use
    As a premium low cost benchtop X-ray Fluorescence (XRF) analyzer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control elemental analysis applications.

    NEX QC is optimized for quality control applications
    Specifically designed for routine quality control applications, the Rigaku NEX QC features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience. The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD). Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.



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    Nex QC
    Nex QC

    Nex QC+


    NEX QC+ - Energy Dispersive X-ray Fluorescence Analyzer
    High resolution benchtop EDXRF for rapid qualitative and quantitative elemental analysis
    For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.

    Self-contained NEX QC+ with built-in printer.

  • Analyze 11Na to 92U non-destructively
  • Solids, liquids, alloys, powders and thin films
  • 50kV X-ray tube
  • High resolution SDD detector
  • Smartphone style user interface
  • Multiple automated tube filters
  • Convienient built in thermal printer
  • Unmatched performance-to-price ratio
  • Optional fundamental parameters

  • NEX QC+ for high performance quality control applications
    Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.
    In addition to being remarkably easy to use, each Rigaku NEX QC series elemental analyzer is powered by sophisticated software running on an embedded computer. Empirical calibration curves may be linear, quadratic or hyperbolic fits.
    To compensate for the presence of other elements, intensity-based or concentration-based alpha (α) corrections may be enabled (automatically calculated given sufficient standards).
    C/H correction is also available to compensate for light element matrix changes and/or changes in average atomic number. All calibration functions are accessible via intuitive icons at the touch of a finger. An optional fundamental parameters (FP) package is available.

    EDXRF with high precision and broad elemental coverage
    The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).

    NexQC+ with autosampler, helium and FP options
    Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.



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    Nex QC Quantez
    Software
    Laptop

    Nex QC+ QuantEZ


    NEX QC+ QuantEZ - Energy Dispersive X-ray Fluorescence
    Windows®-based EDXRF for rapid elemental analysis
    As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

    Features:

  • Analyze 11Na to 92U non-destructively
  • Powerful QuantEZ Windows-based software
  • Solids, liquids, alloys, powders and films
  • 50kV X-ray tube for wide elemental coverage
  • SDD detector for superior resolution
  • Multiple automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters

  • Elemental analysis in the field, plant or lab
    Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX QC+ QuantEZ series add to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants - such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma - the NEX QC+ QuantEZ series is the reliable choice for routine elemental analysis

    50kV X-ray tube and SDD detector
    The shuttered 50kV X-ray tube and Peltier cooled Silicon Drift Detector (SDD) detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

    Options: autosampler, helium and FP
    Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.



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